A low-energy electron point-source projection microscope not using a sharp metal tip performs well in long-range imaging

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Low-energy electron point projection microscopy of suspended graphene, the ultimate ‘microscope slide’

Point projection microscopy (PPM) is used to image suspended graphene by using low-energy electrons (100–205 eV). Because of the low energies used, the graphene is neither damaged nor contaminated by the electron beam for doses of the order of 107 electrons per nm2. The transparency of graphene is measured to be 74%, equivalent to electron transmission through a sheet twice as thick as the cova...

متن کامل

Near-field Raman spectroscopy using a sharp metal tip.

Near-field Raman spectroscopy with a spatial resolution of 20 nm is demonstrated by raster scanning a sharp metal tip over the sample surface. The method is used to image vibrational modes of single-walled carbon nanotubes. By combining optical and topographical signals rendered by the single-walled carbon nanotubes, we can separate near-field and far-field contributions and quantify the observ...

متن کامل

A monochromatic, aberration-corrected, dual-beam low energy electron microscope.

The monochromatic, aberration-corrected, dual-beam low energy electron microscope (MAD-LEEM) is a novel instrument aimed at imaging of nanostructures and surfaces at sub-nanometer resolution that includes a monochromator, aberration corrector and dual beam illumination. The monochromator reduces the energy spread of the illuminating electron beam, which significantly improves spectroscopic and ...

متن کامل

Femtosecond photoelectron point projection microscope.

By utilizing a nanometer ultrafast electron source in a point projection microscope we demonstrate that images of nanoparticles with spatial resolutions of the order of 100 nanometers can be obtained. The duration of the emission process of the photoemitted electrons used to make images is shown to be of the order of 100 fs using an autocorrelation technique. The compact geometry of this photoe...

متن کامل

Lattice imaging using plasmon energy-loss electrons in an energy-filtered transmission electron microscope

Lattice images formed by plasmon energy-loss electrons in an energy-filtered transmission electron microscope are compared for different experimental parameters. The image resolution is primarily determined by chromatic aberration which is controlled by the width of the energy selection window. With an energy slit 3 eV in width, the plasmon loss electron image shows the same resolution and cont...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Ultramicroscopy

سال: 2019

ISSN: 0304-3991

DOI: 10.1016/j.ultramic.2019.02.022